AMBIENTUM BIOETHICA BIOLOGIA CHEMIA DIGITALIA DRAMATICA EDUCATIO ARTIS GYMNAST. ENGINEERING EPHEMERIDES EUROPAEA GEOGRAPHIA GEOLOGIA HISTORIA HISTORIA ARTIUM INFORMATICA IURISPRUDENTIA MATHEMATICA MUSICA NEGOTIA OECONOMICA PHILOLOGIA PHILOSOPHIA PHYSICA POLITICA PSYCHOLOGIA-PAEDAGOGIA SOCIOLOGIA THEOLOGIA CATHOLICA THEOLOGIA CATHOLICA LATIN THEOLOGIA GR.-CATH. VARAD THEOLOGIA ORTHODOXA THEOLOGIA REF. TRANSYLVAN
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Authors: M. TOMA, C. LUNG, D. MARCONI, A. POP.
DOI: 10.24193/subbphys.2018.08
Published Online: 2018-12-20
Published Print: 2018-12-20
pp. 89-99
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Zinc oxide (ZnO), and Ni-doped ZnO (NZO) thin films were deposited on glass substrates by radio frequency (RF) magnetron sputtering for three different distances between substrate-target. The influence of the distance between substrate-target upon structure of the thin films was analyzed by X-ray diffraction (XRD) and the grain size was determined by theoretical calculations. Optical transmission measurements show the influence of doping and distance between substrate-target on the optical band gap.
Keywords: XRD, transmittance, Ni-ZnO thin films, RF magnetron sputtering
