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    STUDIA PHYSICA - Issue no. 1-2 / 2018  
         
  Article:   STRUCTURAL AND OPTICAL CHARACTERIZATION OF ZnO FILMS DOPED WITH Ni.

Authors:  M. TOMA, C. LUNG, D. MARCONI, A. POP.
 
       
         
  Abstract:  
DOI: 10.24193/subbphys.2018.08

Published Online: 2018-12-20
Published Print: 2018-12-20
pp. 89-99

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Zinc oxide (ZnO), and Ni-doped ZnO (NZO) thin films were deposited on glass substrates by radio frequency (RF) magnetron sputtering for three different distances between substrate-target. The influence of the distance between substrate-target upon structure of the thin films was analyzed by X-ray diffraction (XRD) and the grain size was determined by theoretical calculations. Optical transmission measurements show the influence of doping and distance between substrate-target on the optical band gap.

Keywords: XRD, transmittance, Ni-ZnO thin films, RF magnetron sputtering
 
         
     
         
         
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