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    STUDIA PHYSICA - Issue no. 1 / 2012  
         
  Article:   EPITAXIAL TiN THIN FILMS GROWN ON BIAXIALLY TEXTURED Ni-W SUBSTRATES.

Authors:  .
 
       
         
  Abstract:  

In this paper we present a detailed structural study of epitaxial TiN thin films deposited on biaxially textured Ni- 5%at.W (NiW) substrates by reactive magnetron sputtering. NiW substrates are used as a base material in coated conductors manufacturing. TiN is used as a buffer layer between NiW and YBCO. Structural investigations were carried out using X-ray diffraction. Based on X-rays diffraction analysis it was concluded that the TiN film grew epitaxially on NiW substrates.

 

Keywords: titanium nitride, thin films, epitaxy, sputtering deposition

 
         
     
         
         
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