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    STUDIA CHEMIA - Issue no. 1 / 2008  
         
  Article:   MOTT-SCHOTTKY ANALYSIS OF ELECTRODEPOSITED ZNS THIN FILMS.

Authors:  ADRIAN NICOARǍ.
 
       
         
  Abstract:  
Some semiconductor properties, flat band potential and donor density, of electrodeposited ZnS thin films were evaluated by Mott-Schottky analysis. To this aim the depletion region capacitance of semiconductor/solution interface was determined by analysis of impedance spectrums.
 
         
     
         
         
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